Texas Instruments UCC5880-Q1 Automotive Isolated 20A Gate Driver

Texas Instruments UCC5880-Q1 Automotive Isolated 20A Gate Driver is an isolated, highly configurable adjustable slew-rate gate driver designed to drive high-power SiC MOSFETs and IGBTs in electric and hybrid electric vehicle (EV/HEV) applications. Protections include shunt resistor-based overcurrent, overtemperature (PTC, NTC, or diode), DESAT detection, and programmable soft turnoff (STO) and two-level soft turnoff (2STO) current. The UCC5880-Q1 device includes an active Miller clamp and an active gate pull-down while the driver is unpowered, which both help reduce the application size. An integrated 10-bit ADC can monitor up to two analog inputs, VCC2, DESAT, and the gate driver temperature for enhanced system management.

Texas Instruments UCC5880-Q1 Automotive Isolated 20A Gate Driver also features diagnostics and detection functions to simplify the design of ASIL-compliant systems. The parameters and thresholds for these features are configurable using the SPI, enabling the driver to be used with nearly any IGBT or SiC MOSFET. Applications include EV/HEV traction inverters and EV/HEV power modules.

Features

Dual-output driver with real-time variable drive strength:
- ±15A and ±5A drive current outputs
- Digital input pins for drive strength adjustment without SPI
- 3 resistor settings R1, R2, or R1||R2
- Integrated 4A active Miller clamp or optional external drive for Miller clamp transistor
Primary and secondary side active short circuit (ASC) support
Internal and external supply undervoltage and overvoltage protection
Driver die temperature sensing and overtemperature protection
Short-circuit protection:
- 110ns response time to DESAT event
- DESAT protection - selections up to 14V
- Shunt resistor-based short-circuit (SC) and over-current (OC) protection
- Configurable protection threshold values and blanking times
- Programmable soft turnoff (STO) and two-level soft turnoff (2STO) current
Integrated 10-bit ADC
- Power switch temperature, driver die temperature, DESAT pin voltage, VCC2 voltage, phase current, DC Link voltage
- Programmable digital comparators

Advanced VCE/VDS clamping circuit
Functional safety compliant:
- Developed for functional safety applications
- Documentation available to aid ISO 26262 system design up to ASIL D
Integrated diagnostics:
- Built-in self-test (BIST) for protection comparators
- Gate threshold voltage measurement for power device health monitoring
- INP to transistor gate path integrity
- Internal clock monitoring
- Fault alarm and warning outputs
- ISO communication data integrity check
SPI-based device reconfiguration, verification, supervision, and diagnosis
150V/ns CMTI
AEC-Q100 qualified with the following results
- Device temperature grade 1: -40°C to +125°C ambient operating temperature range
- Device HBM ESD classification level 2
- Device CDM ESD classification level C2B