Texas Instruments SN74AC10-Q1 Automotive 3-Input NAND Gates

Texas Instruments SN74AC10-Q1 Automotive 3-Input NAND Gates are high-performance, automotive-qualified logic ICs with three independent 3-input NAND gates. These NAND gates are designed for robust operation in harsh environments and support a wide voltage range and high output drive capabilities. The SN74AC10-Q1 gates operate at a 1.5V to 6V supply voltage range,  up to 6V input accepts voltage, and continuous ±24mA output drive at 5V. These NAND gates support up to ±75mA output drive at 5V in short bursts and drive 50Ω transmission lines. The SN74AC10-Q1 devices are AEC-Q100 qualified for automotive applications. These NAND gates are available in a wettable flank QFN package and are ideal for an alarm/tamper detect circuit and an S-R latch.

Features

  • AEC-Q100 qualified for automotive applications:
    • -40°C to 125°C device temperature grade 1
    • Device HBM ESD classification level 2
    • Device CDM ESD classification level C4B
  • Available in a wettable flank QFN package
  • Wide operating range of 1.5V to 6V
  • Inputs accept voltages up to 6V
  • Continuous ±24mA output drive at 5V
  • Supports up to ±75mA output drive at 5V in short bursts
  • Drives 50Ω transmission lines
  • Maximum tpd of 8.5ns at 5V, 50pF load

Applications

  • Alarm/tamper detect circuit
  • S-R latch

Typical Application Block Diagram

Block Diagram - Texas Instruments SN74AC10-Q1 Automotive 3-Input NAND Gates

Typical Characteristics Curve

Performance Graph - Texas Instruments SN74AC10-Q1 Automotive 3-Input NAND Gates

Dimension Diagram

Mechanical Drawing - Texas Instruments SN74AC10-Q1 Automotive 3-Input NAND Gates
Published: 2025-09-17 | Updated: 2025-09-25