onsemi EVBUM2901G-EVB Evaluation Board
onsemi EVBUM2901G-EVB Evaluation Board is designed for HOT temperature testing and variable pulse-width modulation (PWM) generation. The onsemi EVBUM2901G-EVB supports testing discrete SiC and Si packages with up to 1200V breakdown voltage using compatible daughter cards. The board integrates a laboratory-grade PWM generator, heat source, and +5V output into a compact design powered by a single 12V adapter (included), enabling efficient and reliable testing in a streamlined setup.
Features
- Hotplate PCB with low thermal resistance
- Hotplate temperature regulation (OFF, 125°C, 150°C, 175°C)
- 10pulse PWM generator (5V, Freq. 30kHz, pulse width from 0.2s to 10s)
- Fully compatible with discrete double pulse tester
- Power adapter included
- Intuitive interface using LED indicators and display
Applications
- Discrete package testing (SiC, Si)
- High-voltage device characterization
- Thermal performance evaluation
- Pulse-width modulation analysis
Overview
Published: 2025-01-20
| Updated: 2025-02-19