TIOS102YAHR

Texas Instruments
595-TIOS102YAHR
TIOS102YAHR

Mfr.:

Description:
Sensor Interface Digital sensor outpu t driver with low r

Datasheet:
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Availability

Stock:
Non-Stocked
Factory Lead Time:
12 Weeks Estimated factory production time.
Minimum: 1   Multiples: 1
Unit Price:
-,-- €
Ext. Price:
-,-- €
Est. Tariff:
Packaging:
Full Reel (Order in multiples of 1500)

Pricing (EUR)

Qty. Unit Price
Ext. Price
Cut Tape / MouseReel™ †
2,18 € 2,18 €
2,13 € 21,30 €
2,11 € 52,75 €
2,06 € 206,00 €
2,03 € 507,50 €
2,00 € 1.000,00 €
1,97 € 1.970,00 €
Full Reel (Order in multiples of 1500)
1,32 € 1.980,00 €
1,30 € 3.900,00 €
† A MouseReel™ fee of 5,00 € will be added and calculated in your basket. All MouseReel™ orders are non-cancellable and non-returnable. ↩

Product Attribute Attribute Value Select Attribute
Texas Instruments
Product Category: Sensor Interface
RoHS:  
Digital Sensor Output Driver
Serial, SPI
36 V
4.75 V
1.5 mA
- 40 C
+ 125 C
SMD/SMT
DSBGA-12
Reel
Cut Tape
MouseReel
Brand: Texas Instruments
Features: Large Capacitive Load Driving Capability
Input Type: Logic
Input Voltage: 4.75 V to 36 V
Number of Channels: 1 Channel
Output Current: 20 mA
Output Type: Push-Pull
Output Voltage: 3.3 V
Product: Digital Sensor Output Drivers
Product Type: Sensor Interface
Series: TIOS102
Factory Pack Quantity: 1500
Subcategory: Interface ICs
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Attributes selected: 0

Datasheet

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CAHTS:
8542390000
USHTS:
8542390090
MXHTS:
8542399999
ECCN:
EAR99

TIOS102/TIOS102x Digital Sensor Output Drivers

Texas Instruments TIOS102/TIOS102x Digital Sensor Output Drivers are configurable as high-side, low-side, or push-pull drivers. These devices can withstand up to 1.2kV (500Ω) of IEC 61000-4-5 surge and feature integrated reverse polarity protection. A pin-programmable interface in the Texas Instruments TIOS102/TIOS102x allows easy interfacing with the circuits. The output current limit can be configured using an external resistor. Fault reporting and internal protection functions are provided for undervoltage, overcurrent, and overtemperature conditions.

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