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MTE5116N2

Name: Marktech Optoelectronics MTE5116N2
Brand: Marktech Optoelectronics
SKU: 193-MTE5116N2
Price: 13.93 EUR
Availability: InStock

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Mouser No:

193-MTE5116N2

Mfr. No:

MTE5116N2

Mfr.:

Marktech Optoelectronics

Description:

Infrared Emitters SWIR Emitter 1650nm

Datasheet:

MTE5116N2 Datasheet (PDF)

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Pricing (EUR)

Qty.	Unit Price	Ext. Price
	13,93 €	13,93 €
	10,46 €	104,60 €
	9,40 €	940,00 €
	8,95 €	4.475,00 €
	8,82 €	8.820,00 €
2.500	Quote

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Product Attribute	Attribute Value	Select Attribute
Manufacturer:	Marktech Optoelectronics
Product Category:	Infrared Emitters
RoHS:
Mounting Style:	Through Hole
Wavelength:	1650 nm
Beam Angle:	45 deg
If - Forward Current:	50 mA
Vf - Forward Voltage:	950 mV
Power Rating:	110 mW
Minimum Operating Temperature:	- 20 C
Maximum Operating Temperature:	+ 80 C
Packaging:	Bulk
Brand:	Marktech Optoelectronics
Product Type:	IR Emitters (IR LEDs)
Factory Pack Quantity:	1
Subcategory:	Infrared Data Communications

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Datasheet

MTE5116N2 Datasheet (PDF)

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Compliance Codes

USHTS:: 8541410000
ECCN:: EAR99

Origin Classifications

Country of Origin:: Japan
Assembly Country of Origin:: Not available
Country of Diffusion:: Not available

The country is subject to change at the time of shipment.

Short Wavelength Infrared Emitters

Marktech Optoelectronics Short Wavelength Infrared (SWIR) Emitters include both through-hole and surface-mount packages with wavelengths ranging from 1020nm to 1900nm. The SWIR emitters operate from 20mA to 350mA current range and are designed for high-power applications. These emitters consist of a high-output infrared die in a water-clear, 5mm plastic-molded package. Marktech Optoelectronics SWIR emitters offer high-speed light emission across spectral ranges not easily detected by standard detectors and are ideal for material and chemical analysis. Typical applications include optical switches, optical sensors, fiber-optic communication, biofluorescence and blood chemistry analysis, night vision, safety equipment, currency validation, fiber optics, and inspection systems.