B2987C-US120

Keysight
372-B2987C-US120
B2987C-US120

Mfr.:

Description:
Digital Multimeters Electrometer/High Resistance Meter, 0.01fA, 1000V, Battery; Power cord - United States and Canada - 120V

Lifecycle:
New Product:
New from this manufacturer.
Datasheet:
More Information
Learn more about Keysight B2987C-US120
Product available only to OEM/EMS and design business customers. Product is not shipped to consumers in the EU or the UK

Availability

Stock:
0

You can still purchase this product for backorder.

On Order:
2
Expected 4/8/2026
Factory Lead Time:
10
Weeks Estimated factory production time for quantities greater than shown.
Minimum: 1   Multiples: 1
Unit Price:
-,-- €
Ext. Price:
-,-- €
Est. Tariff:
This Product Ships FREE

Pricing (EUR)

Qty. Unit Price
Ext. Price
17.665,37 € 17.665,37 €

Product Attribute Attribute Value Select Attribute
Keysight
Product Category: Digital Multimeters
Delivery Restrictions:
 Product available only to OEM/EMS and design business customers. Product is not shipped to consumers in the EU or the UK
RoHS:  
Ammeters
0.4 %
6 1/2 Digit
Auto, Manual
348 mm
213 mm
88 mm
Brand: Keysight
Country of Assembly: Not Available
Country of Diffusion: Not Available
Country of Origin: MY
Current Rating: 0.01 fA to 20 mA
Product Type: Multimeters
Factory Pack Quantity: 1
Subcategory: Test Equipment
Voltage Rating: 1 kV
Part # Aliases: B2987C/903
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Attributes selected: 0

Datasheet

B2900C/CL Precision Source/Measure Units

Keysight Technologies B2900C/CL Precision Source Measure Units (SMUs) feature a compact design and can source and measure both voltage and current. These capabilities make these models suitable for various IV measurement tasks that require both high resolution and accuracy. Specifications include a maximum voltage of ±210V, maximum ±3A DC current, and integrated 4-quadrant source measurement capabilities. Due to the precision minimum of 10fA/100nV sourcing and measuring resolution, a color LCD Graphical User Interface (GUI) and other task-based viewing modes will improve productivity for debug, test, and characterization.

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